DATE 2023

DATE 2023
26th Design, Automation and Test in Europe Conference
Event in series	DATE
Dates	2023/04/17 (iCal) - 2023/04/19
Homepage:	https://date23.date-conference.com/
Location
Location:	Antwerp, Belgium
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Table of Contents

Scope of the Event

The 26th DATE conference is the main European event bringing together designers and design automation users, researchers and vendors as well as specialists in hardware and software design, test and manufacturing of electronic circuits and systems. DATE puts strong emphasis on both technology and systems, covering ICs/SoCs, emerging technologies, embedded systems and embedded software.

Areas of Interest

Within the scope of the conference, the main areas of interest are: design automation, design tools and hardware architectures for electronic and embedded systems; test and dependability at system, chip, circuit and device level for analogue and digital electronics; modelling, analysis, design and deployment of embedded software and cyber-physical systems; application design and industrial design experiences. Topics of interest include, but are not restricted to:

• System Specification and Modelling
• System-level Design Methodologies and High-Level Synthesis
• System Simulation and Validation
• Design and Test for Analog and Mixed-Signal Circuits and Systems, and MEMS
• Design and Test of Hardware Security Primitives
• Design and Test of Secure Systems
• Formal Methods and Verification
• Network-on-Chip and on-chip Communication
• Architectural and Microarchitectural Design
• Low-power, Energy-efficient and Thermal-aware Design
• Approximate Computing
• Reconfigurable Systems
• Logical and Physical Analysis and Design
• Emerging Design Technologies for Future Computing
• Emerging Design Technologies for Future Memories
• Power-efficient and Sustainable Computing
• Smart Cities, Internet of Everything, Industry 4.0
• Automotive Systems and Smart Energy Systems
• Augmented Living and Personalized Healthcare
• Secure Systems, Circuits and Architectures
• Self-adaptive and Context-aware Systems
• Applications of Emerging Technologies
• Industrial Experiences
• Modelling and Mitigation of Defects, Faults, Variability and Reliability
• Test Generation, Test Architectures, Design for Test, and Diagnosis
• Dependability and System-Level Test
• Embedded Software Architectures, Compilers and Tool Chains
• Real-time, Dependable and Privacy-Enhanced Systems
• Machine Learning Solutions for Embedded and Cyber-Physical Systems
• Design Methodologies for Machine Learning Architectures
• Design Modelling and Verification for Embedded and Cyber-Physical Systems