# Test 1
# Test 2
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304 bytes (29 words) - 13:38, 30 July 2020
| Title = IEEE 7th International Board Test Workshop
...oard Test workshops, perspectives are invited from contract manufacturers, test equipment providers, researchers, end users and systems providers.
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3 KB (407 words) - 21:23, 14 October 2008
* Board and System Test and Diagnosis
* System-on-Chip test
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2 KB (273 words) - 21:24, 14 October 2008
|additions=test page form
|location=test location
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468 bytes (50 words) - 09:47, 16 January 2017
Test
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4 bytes (1 word) - 11:31, 30 July 2020
#REDIRECT [[IPDPS-Test]]
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24 bytes (2 words) - 14:52, 31 July 2019
#REDIRECT [[IM Test]]
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21 bytes (3 words) - 07:40, 26 July 2019
#REDIRECT [[Test program]]
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26 bytes (3 words) - 09:48, 16 January 2017
#REDIRECT [[Program test]]
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26 bytes (3 words) - 09:48, 16 January 2017
Test
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49 bytes (5 words) - 13:38, 30 July 2020
|Title=HLDVT 2016 : IEEE International High-Level Design Validation and Test Workshop
|Field=validation, verification, debug, test
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402 bytes (51 words) - 14:17, 8 July 2016
|Title=26th Design, Automation and Test in Europe Conference
...rchers and vendors as well as specialists in hardware and software design, test and manufacturing of electronic circuits and systems. DATE puts strong emph
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3 KB (327 words) - 07:33, 26 November 2025
|Title=Design, Automation and Test in Europe Conference
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108 bytes (16 words) - 23:15, 17 March 2020
of five tracks gathering elleven test cases and different
test bench tuning are available. Final results of the
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3 KB (362 words) - 09:35, 2 August 2009
|Title=27th Design, Automation and Test in Europe Conference
...rchers and vendors as well as specialists in hardware and software design, test and manufacturing of electronic circuits and systems. DATE puts strong emph
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3 KB (332 words) - 23:05, 26 November 2025
|Title=25th Design, Automation and Test in Europe Conference
...rchers and vendors as well as specialists in hardware and software design, test and manufacturing of electronic circuits and systems. DATE puts strong emph
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2 KB (306 words) - 07:27, 26 November 2025
|Title=IEEE International Test Conference
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136 bytes (18 words) - 11:08, 27 March 2020
test bench tuning are available. Final results of the
May 19th, 2008: First publication of test cases
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3 KB (367 words) - 21:36, 14 October 2008
...lysis, test oracles, test management, monitoring and runtime verification, test frameworks
...utomata, state machines, process algebra, logics, UML, HOL, Markov-chains, test generation from models, model coverage
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3 KB (405 words) - 08:56, 24 April 2016
|Title=3rd IEEE International Design and Test Workshop
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330 bytes (45 words) - 16:49, 28 September 2008