DATE 2022

DATE 2022
25th Design, Automation and Test in Europe Conference
Ordinal	25
Event in series	DATE
Dates	2022/03/14 (iCal) - 2022/03/23
Location
Location:	Online (Virtual)
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Table of Contents

Scope of the Event

The 25th DATE conference and exhibition is the main European event bringing together designers and design automation users, researchers and vendors as well as specialists in hardware and software design, test and manufacturing of electronic circuits and systems. DATE puts strong emphasis on both technology and systems, covering ICs/SoCs, emerging technologies, embedded systems and embedded software.

Areas of Interest

Within the scope of the conference, the main areas of interest are: design automation, design tools and hardware architectures for electronic and embedded systems; test and dependability at system, chip, circuit and device level for analogue and digital electronics; modelling, analysis, design and deployment of embedded software and cyber-physical systems; application design and industrial design experiences.

Topics of interest include, but are not restricted to:

• System Specification and Modelling
• System-level Design Methodologies and High-Level Synthesis
• System Simulation and Validation
• Formal Methods and Verification
• Design and Test for Analogue and Mixed-Signal Circuits and Systems, and MEMS
• Design and Test of Secure Systems
• Network on Chip and Communication-Centric Design
• Architectural and Microarchitectural Design
• Low-power, Energy-efficient and Thermal-aware Design
• Approximate Computing
• Reconfigurable Systems
• Logical and Physical Analysis and Design
• Emerging Design Technologies for Future Computing
• Emerging Design Technologies for Future Memories
• Power-efficient and Sustainable Computing
• Robotics and Industry 4.0
• Automotive Systems and Smart Energy Systems
• Augmented Living and Personalized Healthcare
• Secure Systems, Circuits and Architectures
• Self-adaptive and Learning Systems
• Applications of Emerging Technologies
• Modelling and Mitigation of Defects, Faults, Variability and Reliability
• Test Generation, Test Architectures, Design for Test, and Diagnosis
• Microarchitecture-Level Dependability
• System-Level Dependability
• Real-time and Dependable Systems
• Embedded Systems for Deep Learning
• Model-based Design, Verification and Security for Embedded Systems
• Embedded Software Architectures, Compilers and Tool Chains
• Cyber-Physical Systems Design