| Title = 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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...ability in the advent of catastrophic failures, confidentiality, intrusion tolerance, etc. Dependability is a concept that considers all these cross-cutting con
* Fault tolerance in databases and transactional systems.
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|Field=dependability, security, fault-tolerance, testing
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* Fault Tolerance
* Fault Model and Fault Simulation
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...tworks, inter-operability, security, trusted and dependable systems, fault tolerance, virtual subnets for ORC.
...nt, extensibility, synchronization, resource allocation, scheduling, fault tolerance, security.
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...ical and sensor network applications. Most recently, reliability and fault tolerance has been raised to be one of the most crucial topics in the core and SoC de
* Reliability and Fault Tolerance
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Fault-Tolerance and dependability
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• Security, Survivability and Fault Tolerance
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inter-operability, security, trusted and dependable systems, fault
tolerance, virtual subnets for ORC.
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tools and methods for cost-effectively developing reliable, fault
* Fault tolerance techniques
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Reliability and Fault-Tolerance
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CAD tools, fault tolerance, specifications and interfaces, networks-on-a-chip,
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** Portability, quality of service, or fault-tolerance in cluster and Grid computation
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* Availability, Reliability and Fault Tolerance
* Dependability, Reliability and Fault Tolerance
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* fault-tolerance and dependability,
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...s, grid benchmarking, data distribution and replication on the grid, fault tolerance and efficiency of grid applications, novel models of grid computing, includ
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...ftware development tools with middleware, traditional dependability, fault tolerance, security, and adaptivity concepts, together with social and psychological
* Other fault tolerance techniques, including transactions and explicit control of quality of servi
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...researchers and practitioners in the areas of VLSI design, test and fault tolerance to come together to discuss new research ideas and present new research res
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...and reliability, online testing techniques, static and dynamic defect- and fault-recoverability, and variation-aware design.
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