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• ADCSS 2008
  ...it cost efficient to use a qualified code generator or to run a validation test suite on the target? The Auto-coding also enables the automatic traceabilit ...igh percentage of coverage. In Statistical testing (e.g. Monte Carlo), the test cases are selected from the input domain (or predefined range) randomly bas
  18 KB (2,714 words) - 23:23, 14 October 2008
• VLSI-DAT 2009
  | Title = International Symposium on VLSI Design, Automation and Test * Test generation and fault simulation
  2 KB (282 words) - 23:21, 14 October 2008
• ICMTS 2009
  | Title = IEEE International Conference on Microelectronic Test Structures
  541 bytes (62 words) - 23:21, 14 October 2008
• ICMTS 2008
  | Title = IEEE International Conference on Microelectronic Test Structures
  563 bytes (63 words) - 23:22, 14 October 2008
• SAECSIS 2009
  ...efficiently and effectively supporting roles in their design, simulation, test and runtime tasks of a typical production automation system, without the ne
  6 KB (778 words) - 23:22, 14 October 2008
• BTW 2008
  | Title = IEEE 7th International Board Test Workshop ...oard Test workshops, perspectives are invited from contract manufacturers, test equipment providers, researchers, end users and systems providers.
  3 KB (407 words) - 23:23, 14 October 2008
• NDCS 2008
  | Title = 1st IEEE International Workshop On Design and Test of Nano Devices, Circuits and Systems
  645 bytes (76 words) - 23:23, 14 October 2008
• IMS3TW 2008
  | Title = IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop
  565 bytes (67 words) - 23:23, 14 October 2008
• ETS 2008
  | Title = 13th IEEE European Test Symposium
  518 bytes (58 words) - 23:23, 14 October 2008
• DELTA 2008
  | Title = IEEE International Workshop on Electronic Design, Test and Application
  571 bytes (66 words) - 23:24, 14 October 2008
• ATE 2007
  | Title = IEEE International Workshop On Automated Test Equipment : Vision ATE 2020
  569 bytes (64 words) - 23:24, 14 October 2008
• NEWCAS-TAISA 2009
  * Test and verification
  3 KB (377 words) - 23:24, 14 October 2008
• DATICS 2009
  * ATPG, design-for-testability and built-in self test methodologies
  9 KB (1,181 words) - 00:37, 15 October 2008
• ICTD 2009
  * Board and System Test and Diagnosis * System-on-Chip test
  2 KB (273 words) - 23:24, 14 October 2008
• MNRC 2008
  * Test, Verification, and Reliability
  2 KB (228 words) - 23:24, 14 October 2008
• NEWCAS 2008
  * Test and verification
  3 KB (391 words) - 23:24, 14 October 2008
• IDT 2007
  | Title = 2nd International Design and Test Workshop ...resent new research results. This event will provide the only VLSI Design &Test-specific meeting in the MEA region.
  2 KB (229 words) - 10:03, 29 May 2016
• ICONS 2009
  Test systems
  11 KB (1,492 words) - 23:26, 14 October 2008
• ICIEA 2009
  Aerospace Electronics and Information System: Design, integration, test or analysis of electronic components and systems. Acquisition, transmission
  4 KB (561 words) - 23:29, 14 October 2008
• IAV 2010
  * Applications of Autonomous Intelligent Vehicles: case studies and test evaluations. Land (indoors and outdoors), marine (surface and underwater),
  2 KB (285 words) - 14:16, 9 October 2009

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