IRPS 2020: Difference between revisions
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|State=Texas | |State=Texas | ||
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|has general chair=Gaudenzio Meneghesso | |||
|has program chair=Charles Slayman | |||
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Sollte eigentlich vom 29.03.2020-02.04.2020 in Dallas, Texas, USA stattfinden, wurde aufgrund der COVID-19 Pandemie aber zeitlich verschoben und als Online-Konferenz abgehalten. | Sollte eigentlich vom 29.03.2020-02.04.2020 in Dallas, Texas, USA stattfinden, wurde aufgrund der COVID-19 Pandemie aber zeitlich verschoben und als Online-Konferenz abgehalten. | ||
==Topics of Interest== | |||
IRPS 2021 is soliciting increased participation in the following special focus topic areas. | |||
* Circuit Reliability and Aging – RAS, self-healing, aging aware designs, design tools | |||
* Emerging memory / Neuromorphic Computing– Reliability for PCM, MRAM, RRAM, ferroelectrics | |||
* Reliability of RF/mmW/5G Devices – CMOS, SiGe BiCMOS, SOI, GaAs, GaN | |||
Papers in the following areas are requested. | |||
Circuits, Products, and Systems | |||
* Circuit Reliability and Aging | |||
* IC Product Reliability | |||
* System Electronics Reliability | |||
* Soft Errors | |||
* ESD and Latchup | |||
* Packaging and 2.5D/3D Assembly | |||
* Reliability Testing | |||
* Silicon Photonics | |||
* RF/mmW/5G | |||
Materials, Processing, and Devices | |||
* Transistors | |||
* Gate/MOL Dielectrics | |||
* Beyond CMOS Devices | |||
* Neuromorphic Computing Reliability | |||
* Wide-Bandgap Semiconductors | |||
* Compound and Optoelectronic Devices | |||
* Metallization/BEOL Reliability | |||
* Process Integration | |||
* Failure Analysis | |||
* Memory Reliability | |||
* Photovoltaics | |||
* MEMS | |||
Latest revision as of 11:56, 15 June 2020
| IRPS 2020 | |
|---|---|
2020 IEEE International Reliability Physics Symposium
| |
| Event in series | IRPS |
| Dates | 2020/04/28 (iCal) - 2020/05/30 |
| Homepage: | https://irps.org/ |
| Location | |
| Location: | Dallas, Texas, Online |
| Committees | |
| General chairs: | Gaudenzio Meneghesso |
| PC chairs: | Charles Slayman |
| Table of Contents | |
Sollte eigentlich vom 29.03.2020-02.04.2020 in Dallas, Texas, USA stattfinden, wurde aufgrund der COVID-19 Pandemie aber zeitlich verschoben und als Online-Konferenz abgehalten.
Topics of Interest
IRPS 2021 is soliciting increased participation in the following special focus topic areas.
- Circuit Reliability and Aging – RAS, self-healing, aging aware designs, design tools
- Emerging memory / Neuromorphic Computing– Reliability for PCM, MRAM, RRAM, ferroelectrics
- Reliability of RF/mmW/5G Devices – CMOS, SiGe BiCMOS, SOI, GaAs, GaN
Papers in the following areas are requested.
Circuits, Products, and Systems
- Circuit Reliability and Aging
- IC Product Reliability
- System Electronics Reliability
- Soft Errors
- ESD and Latchup
- Packaging and 2.5D/3D Assembly
- Reliability Testing
- Silicon Photonics
- RF/mmW/5G
Materials, Processing, and Devices
- Transistors
- Gate/MOL Dielectrics
- Beyond CMOS Devices
- Neuromorphic Computing Reliability
- Wide-Bandgap Semiconductors
- Compound and Optoelectronic Devices
- Metallization/BEOL Reliability
- Process Integration
- Failure Analysis
- Memory Reliability
- Photovoltaics
- MEMS